Wafer test (intermediate test): before the mass production test of different types / models of wafers, the company designs test methods in advance according to the composition and characteristics of different functional modules in the chip, selects the optimal test platform, builds the experimental verification software and hardware environment, and finally verifies, confirms and finalizes the test methods. During wafer test and mass production, the test platform (composed of probe card, probe and ate) is selected according to the test plan confirmed in the early stage to test each bare chip in the wafer, and the process of sorting out whether the chip is good or bad or grading.

        We provide different types of prober and AOI machines to support the testing requirements of different products.

         我们拥有多样的测试平台，满足不同的服务需求：